378-826-15 M Plan Apo NIR 100X Objective for bright-field observation in near-infrared range Vision Systems This slender grip is ideal

This slender grip is ideal for testing small and hard-to-reach parts

The measuring probe which is moved in from below has a free stroke of 4 mm and ensures a very high repeatability thanks to its constant measuring force

188-122 Mitutoyo Screw Pitch Gauge: 0

5 mm thick) are supplied as standard accessories

Item number: 12AAM596

378-826-15 M Plan Apo NIR 100X Objective for bright-field observation in near-infrared range Vision Systems This slender grip is idealInfinity Corrected Suitable for Bright Field Inspection and Laser Applications Long Working Distance High Quality Plan Apochromat Design Wavelength Correction from Visible to Near Infrared (1800 nm) High Power Type availabel (M Plan Apo NIR HR) Features Model: M Plan Apo NIR 100X Magnification: 100x Working distance: In Air: 12 mm Corrected Wave Length: 480 1800 nm N. A.: 0. 50 f: 2 mm P. D.: 95 mm R: 0. 6 m D. F.: 1. 1 m FOV 1: 0. 24 mm FOV 2: 0. 05